22nd IEEE Latin-American Test Symposium
Punta del Este, Uruguay, 27th - 29th October 2021
WELCOME BACK TO LATS - WELCOME BACK TO PUNTA DEL ESTE
We are looking forward to leave a difficult and challenging year behind and get back together.
Punta del Este is one of the most beautiful places in Uruguay to gather the test community and enjoy
a fruitful exchange regarding the state-of-the-art in test and reliability of integrated circuits and systems.
Please check this year's preliminary Call for Papers [here].
Casapueblo - hotel, restaurant, museum and the very best place to enjoy sunset
THE 2021 EVENT
The IEEE Latin-American Test Symposium (LATS) is a recognized test and fault tolerance techniques forum attended by professionals from all over the world, in particular from Latin-America, to present and discuss various aspects of system, board, and component testing as well as design, manufacturing and in-field considerations with fault tolerance in mind. All presented papers will be published in the IEEE Xplore Digital Library and the best papers of its 22nd edition will be invited to re-submit to IEEE Design&Test, Journal of Electronic Testing: Theory and Applications (JETTA - Springer), Journal of Low Power Electronics (JOLPE - American Scientific Publishers), and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD).
Topics of interest include but are not limited to:
CAD for robust circuits design
Cross-layer reliability approaches
Dependable system design
Dependable Computer Architectures
Design for Electromagnetic Compatibility (EMC)
Design for reliability
Design for reliability approaches for Low-Power
Design for Robustness
Design for Security
Fault-based attacks and countermeasures
Fault-tolerant and fail-safe systems
Field Diagnosis, maintainability, and reconfiguration
IC- and system-level radiation hardening techniques
Infrastructure, cloud computing, and wired, cellular
and satellite communications
Memory test and repair
On-line testing techniques
Power density and overheating issues in
Quality, yield, reliability and lifespan issues
in nanometer technologies
Reliability issues of Low-Power Design
Self-checking circuits and coding theory
Self-test and self-repair
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
PAPER SUBMISSION INFORMATION
On behalf of the organizing committee, we would like to thank all those who already contributed with their submissions. Soon we will have concluded our thorough review process and notify all authors regarding the selection results.
For additional information, please contact our Program Co-Chairs:
Submission Deadline (Title and Abstract): April 30th, 2021
Submission (Full paper): May 7th, 2021
Notification of Acceptance: June 18th, 2021
Camera Ready: July 2nd, 2021.
To download the Call for Papers, please click [here].
Organized by: Financial Sponsor:
Tima, France IEEE Council on Electronic Design Automation
The Institute of Electrical and Test Technology
Electronics Engineering, Inc. Technical Council