Publications

Fabian Vargas:

Articles in Scientific Journals:

 CERATTI, A. ; COPETTI, T. ; BOLZANI, L. ; Vargas, F. ; FAGUNDES, R. . An On-Chip Sensor to Monitor NBTI Effects in SRAMs. Journal of Electronic Testing, v. 30, p. 159-169, 2014.

 VALDES-PENA, MARIA D. ; FERNANDEZ FREIJEDO, JUDIT ; MOURE RODRIGUEZ, MARIA J. ; RODRIGUEZ-ANDINA, JUAN J. ; SEMIAO, JORGE ; Teixeira, Isabel Maria Cacho ; TEIXEIRA, JOAO PAULO CACHO ; Vargas, Fabian . Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs. IEEE Transactions on Nanotechnology, v. 12, p. 508-517, 2013.

 BRIFF, Pablo ; REY VEGA Leonardo ; Ariel Lutenberg ; Fabian Vargas . On the Trade-off between Power Consumption and Time Synchronization Quality for Moving Targets under Large-Scale Fading Effects in Wireless Sensor Networks. Communications and Network, v. 05, p. 498-503, 2013.

 BRIFF, Pablo ; LUTENBERG, ARIEL ; REY VEGA, LEONARDO ; Vargas, Fabian . On Energy-Efficient Time Synchronization for Wireless Sensors under Large-Scale and Small-Scale Fading Effects. Wireless Sensor Network, v. 05, p. 181-193, 2013.

 BRIFF, Pablo ; LUTENBERG, ARIEL ; VEGA, LEONARDO REY ; Vargas, Fabian ; PATWARY, MOHAMMAD . A Primer on Energy-Efficient Synchronization of WSN Nodes over Correlated Rayleigh Fading Channels. IEEE Wireless Communications Letters, v. PP, p. 1-4, 2013.

 Freijedo, J. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; Vargas, F. ; Teixeira, Isabel Maria Cacho ; TEIXEIRA, João Paulo . Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. Journal of Electronic Testing, v. 28, p. 421-434, 2012.

 BENFICA, Juliano ; Letícia Bolzani Poehls ; Vargas, Fabian ; José Lipovetzky ; Ariel Lutenberg ; GATTI, Edmundo ; HERNANDEZ, Fernando . Customized Platform for TID and EMI IC Combined Measurements: Case-Study and Experimental Results. Journal of Electronic Testing, v. 28, p. 803-816, 2012.

 Lavratti, F. ; A. D. Ceratti ; PRESTES, Dárcio Pinto ; Pinto, A. ; Letícia Bolzani Poehls ; Vargas, F. ; Montez, C. ; HERNANDEZ, Fernando ; GATTI, Edmundo ; Cardenas, C. S. . A Transmission Power Self-Optimization Technique for Wireless Sensor Networks. ISRN Communications and Networking, v. 2012, p. 1-12, 2012.

 BENFICA, Juliano ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; José Lipovetzky ; Ariel Lutenberg ; Sebastián E. García ; GATTI, Edmundo ; HERNANDEZ, Fernando . Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference. IEEE Transactions on Nuclear Science, v. PP, p. 1-5, 2012.

 García, M. P. ; Lindoso, Almudena ; Entrena, L. ; Garcia-Valderas, M. ; Ongil, C. L. ; Pianta, B. ; Letícia Bolzani Poehls ; Vargas, Fabian . Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. Journal of Electronic Testing (Dordrecht. Online), v. 28, p. 777-789, 2012.

 Argyrides, C. ; Chipana, R. D. ; Vargas, F. ; Pradhan, D. K. . Reliability Analysis of H-Tree RAM Memories Implemented with BICS and Parity Codes for Multiple-Bit Upset Correction. IEEE Transactions on Reliability, v. 60, p. 528-537, 2011.

 Vargas, F. ; ZORIAN, Y. ; BOLZANI, Letícia Maria Veiras ; CHAMPAC, V. ; Kastensmidt, F. G. L. . 2011 Latin American Test Workshop (LATW'11). IEEE Design & Test of Computers (Print), v. 28, p. 76-76, 2011.

 Freijedo, J. ; Valdés, M. D. ; Costas, L. ; Moure, M. J. ; Rodríguez-Andina, J. J. ; Semião, J. ; Vargas, F. ; Teixeira, I. C. ; TEIXEIRA, J. P. . Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. Journal of Low Power Electronics (Print), v. 7, p. 185-198, 2011.

 Freijedo, J. ; Costas, L. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; Moure, M. J. ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. Journal of Low Power Electronics (Print), v. 6, p. 339-349, 2010.

 LUBASZEWISK, Marcelo Soares ; VARGAS, F. . Test Technology TC Newsletter: 10th IEEE Latin American Test Workshop (LATW'09). IEEE Design & Test of Computers (Print), v. 26, p. 94-95, 2009.

 SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Time Management for Low-Power Design of Digital Systems. Journal of Low Power Electronics (Print), v. 4, p. 410-419, 2008.

 Freijedo, J. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems. Journal of Low Power Electronics (Print), v. 4, p. 385-391, 2008.

 SEMIÃO, JORGE FILIPE L.C. ; Vargas, Fabian Luis ; IRAGO, MARCIAL JESúS RODRà GUEZ ; Santos, Marcelino Bicho dos ; Teixeira, Isabel Maria Cacho ; RODRà GUEZ-ANDINA, JUAN J. ; PICCOLI, Leonardo Bisch ; TEIXEIRA, JOà O PAULO . Signal Integrity Enhancement in Digital Circuits. IEEE Design & Test of Computers (Print), v. 25, p. 452-461, 2008.

 BERNARDI, Paolo ; BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Transactions on Computers (Print), Los Alamitos Circle - CA, USA, v. 55, n.Feb, p. 185-198, 2006.

 SICARD, E. ; VARGAS, F. ; HERNANDEZ, Fernando ; FIORI, F. ; TEIXEIRA, João Paulo . Design and Test on Chip for EMC. IEEE Design & Test of Computers (Print), v. 23, p. 502-503, 2006.

 VARGAS, F. . . IEEE Design & Test of Computers (Print), v. 23, p. 185-185, 2006.

 BARROS JUNIOR, Daniel ; RODRIGUEZ-IRAGO, Marcial ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; VARGAS, F. ; TEIXEIRA, João Paulo . Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. Journal of Electronic Testing, New York, USA., v. 21, p. 349-363, 2005.

 VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel ; BRUM, Diogo Becker de . Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems. Journal of Electronic Testing, New York, USA, v. 20, n.4, p. 397-411, 2004.

 VARGAS, F. ; BOLZANI, Letícia ; BRUM, Diogo Becker de ; PRESTES, Dárcio Pinto . Appending On-Line Fault Detection Mechanisms into Application Code to Handle EMI in Embedded Electronics: a Case Study. Ingeniería Electrónica Automática y Comunicaciones, La Havana, Cuba, v. XXV, n.1, p. 82-90, 2004.

 VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. Journal of Electronic Testing, New York, USA, v. 19, n.1, p. 61-72, 2003.

 ACLE, Júlio Perez ; CHAMPAC, V. ; ROY, K. ; SANTIAGO, A. S. ; TEIXEIRA, J. P. ; VARGAS, F. ; ZORIAN, Y. . Design and Test Education in Latin America. IEEE Design & Test of Computers (Print), Los Alamitos, CA - USA, v. 19, n. May-June, p. 106-113, 2002.

 BEZERRA, Eduardo ; VARGAS, F. ; GOUGH, M. P. . Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques. Journal of Electronic Testing, New York, USA, v. 17, n.3, p. 163-174, 2001.

 BEZERRA, Eduardo ; VARGAS, F. ; PORTO, Ingrid Jansch ; KITAJIMA, J. P. . Implementing Transparent BIST for Embedded Memories: The Transputer Case Study. Journal of Solid-State Devices and Circuits, Sao Paulo - SP, Brazil, v. 5, n.1, p. 14-19, 1997.

 VARGAS, F. ; NICOLAIDIS, M. . SEU-Tolerant SRAM Design Based on IDDQ Monitoring for Spacecraft Electronics & Test Results. Journal of Solid-State Devices and Circuits, Sao Paulo - SP, Brazil, v. 4, n.2, p. 18-29, 1996.

 CALIN, T. ; VARGAS, F. ; NICOLAIDIS, M. ; VELAZCO, R. . A Low-Cost, Highly Reliable SEU-Tolerant SRAM: Prototype and Test Results. IEEE Transactions on Nuclear Science, Los Alamitos - CA, USA, v. 42, n.6, p. 1592-1598, 1995.

 NICOLAIDIS, M. ; VARGAS, F. ; COURTOIS, B. . Design of Built-in Current Sensors for Concurrent Checking in Radiation Environments. IEEE Transactions on Nuclear Science, Los Alamitos - CA, USA, v. 40, n.6, p. 1584-1590, 1993.

 RUSSEL, J. ; VARGAS, F. ; COURTOIS, B. . E-Beam Testing Using Multiple Adjacent Image Processing for Prototype Validation. Microelectronic Engineering, Netherlands, v. 16, n.1-4, p. 413-420, 1992.

 MARZOUKI, M. ; VARGAS, F. . Using a Knowledge-Based System for Automatic Debugging: Case Study and Performance Analysis. Microelectronic Engineering, Netherlands, v. 16, n.1-4, p. 129-136, 1992.

 

Book Chapter Published:

1. Pinto, A. ; Letícia Bolzani Poehls ; Montez, C. ; VARGAS, F. . Power Optimization for Wireless Sensor Networks. Wireless Sensor Networks / Book 2. 1ed.Shanghai, China: InTech Open Access Publisher Books, 2012, v. 2, p. 1-19.

2. VARGAS, F. . Design of Reliable Embedded Systems to Operate in EM Environments. In: INTI, Buenos Aires - Argentina; Red Pucará - CYTED, Madrid - Spain. (Org.). Special Topics of EMC at Chip and System Levels. 1ed.Buenos Aires, Argentina: Editorial Dunken, 2006, v. 1, p. 11-44.

 

Complete works published in proceedings of conferences:

1. PRATES, W. ; BOLZANI, L. ; HARUTYUNYAN, G. ; Davtyan, A. ; Vargas, F. ; ZORIAN, Y. . Integrating embedded test infrastructure in SRAM cores to detect aging. In: 2013 IEEE 19th International OnLine Testing Symposium (IOLTS), 2013, Chania. 2013 IEEE 19th International On-Line Testing Symposium (IOLTS). v. 1. p. 25-30.

2. Lavratti, F. ; BOLZANI, L. ; Calimera, A. ; Vargas, F. ; MACII, E. . Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs. In: 2013 14th Latin American Test Workshop LATW, 2013, Cordoba. 2013 14th Latin American Test Workshop - LATW. v. 1. p. 1-6.

3. OLIVEIRA, C. ; Benfica, J. D. ; Letícia Bolzani Poehls ; Vargas, F. ; José Lipovetzky ; Ariel Lutenberg ; GATTI, Edmundo ; HERNANDEZ, Fernando ; A. Boyer . Reliability Analysis of an On-Chip Watchdog for Embedded Systems Exposed to Radiation and EMI. In: 9th International Workshop on electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), 2013, Nara, Japan. Proceedings of the 9th International Workshop on electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2013. v. 1. p. 1-6.

4. UBAR, RAIMUND ; Vargas, Fabian ; JENIHHIN, MAKSIM ; RAIK, JAAN ; KOSTIN, SERGEI ; POEHLS, LETICIA BOLZANI . Identifying NBTI-Critical Paths in Nanoscale Logic. In: 2013 Euromicro Conference on Digital System Design (DSD), 2013, Los Alamitos. 2013 Euromicro Conference on Digital System Design. v. 1. p. 136-141.

5. CERATTI, A. ; COPETTI, T. ; BOLZANI, L. ; Vargas, F. . Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. In: 2012 13th Latin American Test Workshop LATW, 2012, Quito. 2012 13th Latin American Test Workshop (LATW). v. 1. p. 1-6.

6. BENFICA, Juliano ; Letícia Bolzani Poehls ; Vargas, F. ; José Lipovetzky ; Ariel Lutenberg ; Sebastián E. García . Configurable Platform for SoC Combined Tests of TID Radiation, Aging and EMI. In: 2012 Asia-Pacific International Symposium on Electromagnetic Compatibility - APEMC'12, 2012, Cingapura. Proceedings of the 2012 Asia-Pacific International Symposium on Electromagnetic Compatibility - APEMC'12. Los Alamitos Circle - CA, USA: IEEE EMC Society, 2012. v. 1. p. 393-396.

7. Dhiego Silva ; OLIVEIRA, C. ; Letícia Bolzani Poehls ; Vargas, Fabian . An Intellectual Property Core to Detect Task Scheduling-Related Faults in RTOS-Based Embedded Systems. In: Simposio Argentino de Sistemas Embebidos 2012 (SASE'12), 2012, Buenos Aires, Argentina. Proceedings of the Simposio Argentino de Sistemas Embebidos 2012 (SASE'12). Buenos Aires, Argentina: Editora San Justo, 2012. v. 1. p. 1-6.

8. BRIFF, Pablo ; Ariel Lutenberg ; REY VEGA Leonardo ; Vargas, Fabian . On the trade-off of power consumption and time synchronization quality in Wireless Sensor Networks. In: IEEE Sensors 2012, 2012, Taipei, Taiwan. Proceedings of the IEEE Sensors 2012. Los Alamitos Circle, CA - USA: IEEE Computer Society, 2012. v. 1. p. 1-4.

9. CERATTI, A. ; COPETTI, T. ; BOLZANI, L. ; Vargas, F. . On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. In: 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012, Tallinn. 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). v. 1. p. 354-359.

10. ZACCHIGNA, Federico Giordano ; Ariel Lutenberg ; Vargas, Fabian . Implementación de un Procesador Multi-Núcleo Basado en el Procesador Plasma. In: Simposio Argentino de Sistemas Embebidos 2012 (SASE'12), 2012, Buenos Aires, Argentina. Proceedings of the Simposio Argentino de Sistemas Embebidos 2012 (SASE'12). Buenos Aires, Argentina: Editora San Justo, 2012. v. 1. p. 1-8.

11. Ridolfi, Pablo ; Scaglia, Sergio ; Ariel Lutenberg ; Martos, Pedro ; Vargas, Fabian . Diseño e implementación de un nodo 802.15.4 para redes inalámbricas de sensores. In: Simposio Argentino de Sistemas Embebidos 2012 (SASE'12), 2012, Buenos Aires, Argentina. Proceedings of the Simposio Argentino de Sistemas Embebidos 2012 (SASE'12). Buenos Aires, Argentina: Editora San Justo, 2012. v. 1. p. 1-6.

12. Valdés, M. D. ; Freijedo, J. ; Moure, M. J. ; ANDINA, Juan José Rodríguez ; SEMIÃO, Jorge ; VARGAS, F. ; Teixeira, Isabel Maria Cacho ; TEIXEIRA, João Paulo . Programmable Sensor for On-Line Checking of Signal Integrity in FPGA-Based Systems Subject to Aging Effects. In: 12th IEEE Latin American Test Workshop (LATW'11), 2011, Porto de Galinhas (PE), Brazil. Proceedings of the 12th IEEE Latin American Test Workshop (LATW'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. -------.

13. Freijedo, J. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits. In: 12th IEEE Latin American Test Workshop (LATW'11), 2011, Porto de Galinhas (PE), Brazil. Proceedings of the 12th IEEE Latin American Test Workshop (LATW'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. -------.

14. Lavratti, F. ; Calimera, A. ; BOLZANI, L. ; Vargas, F. ; MACII, E. . A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs. In: 2011 12th Latin American Test Workshop LATW, 2011, Beach of Porto de Galinhas. 2011 12th Latin American Test Workshop (LATW). v. 1. p. 1-6.

15. García, M. P. ; Lindoso, A. ; Entrena, L. ; Garcia-Valderas, M. ; Ongil, C. L. ; Pianta, B. ; Letícia Bolzani Poehls ; VARGAS, F. . Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness under SEEs: A Case Study. In: 12th IEEE Latin American Test Workshop (LATW'11), 2011, Porto de Galinhas (PE), Brazil. Proceedings of the 12th IEEE Latin American Test Workshop (LATW'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. -------.

16. Carlos Ivan Castro ; Marius Strum ; W. J. Chau ; Vargas, F. . Formally Verifying an RTOS Scheduling Monitor IP Core in Embedded Systems. In: 12th IEEE Latin American Test Workshop (LATW'11), 2011, Porto de Galinhas (PE), Brazil. Proceedings of the 12th IEEE Latin American Test Workshop (LATW'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. -------.

17. BENFICA, Juliano ; POEHLS, LETICIA BOLZANI ; Vargas, Fabian ; LIPOVETZKY, JOSE ; LUTENBERG, ARIEL ; GARCIA, SEBASTIAN E. ; GATTI, Edmundo ; HERNANDEZ, Fernando ; CALAZANS, NEY L. V. . Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. In: 2011 12th Latin American Test Workshop LATW, 2011, Beach of Porto de Galinhas. 2011 12th Latin American Test Workshop (LATW). v. 1. p. 1----.

18. Dhiego Silva ; OLIVEIRA, C. ; Letícia Bolzani Poehls ; VARGAS, F. . An Intellectual Property Core to Detect Task Schedulling-Related Faults in RTOS-Based Embedded Systems. In: 17th IEEE International On-Line Testing Symposium (IOLTS'11), 2011, Athens, Greece. Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. 19-24.

19. Dhiego Silva ; Kleber Hugo Stangherlin ; Letícia Bolzani Poehls ; VARGAS, F. . A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems. In: 16th IEEE European Test Symposium (ETS'11), 2011, Trondheim, Norway. Proceedings of the IEEE European Test Symposium (ETS'11). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2011. v. 1. p. 209-209.

20. BENFICA, Juliano ; Letícia Bolzani Poehls ; VARGAS, F. ; José Lipovetzky ; Ariel Lutenberg ; Sebastián E. García ; GATTI, Edmundo ; HERNANDEZ, Fernando ; CALAZANS, N. L. . Evaluating the Use of a Platform for Combined Tests of Total Ionizing Dose Radiation and Electromagnetic Immunity. In: 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2011), 2011, Sevilla, Spain. Proceedings of the 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2011). Los Alamitos Circle, CA - USA: IEEE Computer Society, 2011. v. 1. p. 473-478.

21. Chipana, R. D. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. . BICS-Based March Test for Resistive-Open Defect Detection in SRAMs. In: 11th IEEE Latin American Test Workshop (LATW'10), 2010, Punta del Este. Proceedings of the 11th IEEE Latin American Test Workshop. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2010. v. 1. p. -------.

22. Pinto, A. ; PRESTES, Dárcio Pinto ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; Montez, C. . Towards a Transmission Power Self-Optimization in Reliable Wireless Sensor Networks. In: 11th IEEE Latin American test Workshop (LATW'10), 2010, Punta del Este. Proceedings of the 11th IEEE Latin American Test Workshop. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2010. v. 1. p. -------.

23. Freijedo, J. ; Valdés, M. D. ; Moure, M. J. ; Costas, L. ; ANDINA, Juan José Rodríguez ; SEMIÃO, Jorge ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Delay Modeling for Power Noise-Aware in Spartan-3A FPGAs. In: VI Southern Programmable Logic Conference (SPL´2010), 2010, Porto de Galinhas (PE), Brazil. Proceedings of the VI Southern Programmable Logic Conference (SPL´2010). Recife (PE): Editora Universitária UFPE, 2010. v. 1. p. 127-132.

24. Lavratti, F. ; PINTO, A.R. ; BOLZANI, L. ; Vargas, F. ; MONTEZ, C. ; HERNANDEZ, F. ; GATTI, E. ; SILVA, C. . Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments. In: 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 2010, Lille. 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools. v. 1. p. 509-515.

25. Tarrillo Olano, J. F. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; GATTI, Edmundo ; HERNANDEZ, Fernando ; Fraigi, L. . Fault-Detection Capability Analysis of a Task-Scheduling Monitor Core in Electromagnetic Interference Environment. In: 8th IEEE East-West Design and Test Symposium (EWDTS'10), 2010, St. Petersburg, Russia. Proceedings of the 8th IEEE East-West Design and Test Symposium (EWDTS'10). Los Alamitos Circle, CA - USA: IEEE Computer Society, 2010. v. 1.

26. Cristófoli, L. F. ; Vásquez Hengles, A. C. ; BENFICA, J. D. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; Atienza, A. ; SILVA, Ferran . Synchronous versus Asynchronous Circuits Reliability under Radiated Electromagnetic Disturbance. In: 9th International Symposium on EMC (EMC EUROPE 2010), 2010, Wroclaw, Poland. Proceedings of the 9th International Symposium on EMC (EMC EUROPE 2010). Los Alamitos Circle: IEEE EMC Society, 2010. v. 1.

27. Vargas, F. ; Rocha, C. A. ; Pianta, B. . Balancing Power Consumption and Reliability in the Embedded Systems Software Design. In: 4th Argentine - 1st Uruguay Conference on Micro-Nanoelectronics, Technology, and Applications (CAMTA - CUMTA) 2010, 2010, Montevideo, Uruguay. Proceedings of the 4th Argentine - 1st Uruguay Conference on Micro-Nanoelectronics, Technology, and Applications (CAMTA - CUMTA) 2010. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2010. v. 1. p. ---.

28. SEMIÃO, Jorge ; Freijedo, J. ; MORAES, Marlon ; Mallmann, M. ; Rocha, C. A. ; BENFICA, J. D. ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; ANDINA, Juan José Rodríguez ; TEIXEIRA, João Paulo ; LUPI, Daniel ; GATTI, Edmundo ; GARCÍA, Luis ; HERNANDEZ, Fernando . Measuring Clock-Signal Modulation Efficiency for Systems-on-Chip in Electromagnetic Interference Environment. In: 10th IEEE Latin American Test Workshop (LATW09), 2009, Búzios, RJ - Brazil. Proceedings of the 10th IEEE Latin American Test Workshop. Los Alamitos Circle, CA - USA: IEEE Computer Society, 2009. v. 1. p. 1-6.

29. VARGAS, F. ; Rocha, C. A. ; Cristófoli, L. F. . Trading-off Power/Reliability in the Embedded Systems Software Design. In: Workshop IBERCHIP 2009, 2009, Buenos Aires, Argentina. Proceedings of the Workshop IBERCHIP 2009. Buenos Aires, Argentina: Universidad de Buenos Aires, Argentina, 2009. v. 1.

30. VARGAS, F. ; Tarrillo Olano, J. F. . Planificador en Hardware para Detección de Fallos en Sistemas Empotrados de Tiempo Real. In: XV Workshop IBERCHIP (IBERCHIP'09), 2009, Buenos Aires, Argentina. Proceedngs of the XV Workshop IBERCHIP. Buenos Aires, Argentina: Universidad de Buenos Aires, Argentina, 2009. v. 1.

31. VARGAS, F. ; Rocha, C. A. ; Pianta, B. ; García, M. P. ; Ongil, C. L. ; Valderas, M. G. ; Entrena, L. . Trading-off Power/Reliability in the Embedded Systems Software Design. In: 15th IEEE International On-Line Testing Symposium (IOLTS), 2009, Sesimbra-Lisbon, Portugal. Proceedings of the 15th IEEE International On-Line Testing Symposium. Los Alamitos Circle - CA, USA: IEEE Computer Computer Society, 2009. v. 1.

32. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies. In: 15th IEEE International On-Line Testing Symposium (IOLTS'09), 2009, Sesimbra-Lisbon, Portugal. Proceedings of the IEEE International On-Line Testing Symposium. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2009. v. 1. p. 223-228.

33. Cristófoli, L. F. ; Vásquez Hengles, A. C. ; BENFICA, J. D. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; Atienza, A. ; SILVA, Ferran . On the Comparison of Synchronous versus Asynchronous Circuits under the Scope of. In: Asia-Pacific Symposium on Electromagnetic Compatibility & Technical Exhibition on EMC RF/Microwave Measurement & Instrumentation (APEMC 2010), 2009, Beijing. Proceedings of the Asia-Pacific Symposium on Electromagnetic Compatibility & Technical Exhibition on EMC RF/Microwave Measurement & Instrumentation. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2009. v. 1.

34. Tarrillo Olano, J. F. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. . A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems. In: 12th Euromicro Conference on Digital System Design (DSD'09), 2009, Patras, Greece. Proceedings of the 12th Euromicro Conference on Digital System Design. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2009. v. 1. p. 341-347.

35. Tarrillo Olano, J. F. ; BOLZANI, Letícia Maria Veiras ; VARGAS, F. ; GATTI, Edmundo ; HERNANDEZ, Fernando ; Fraigi, L. . Fault-Detection Capability Analysis of a Hardware-Scheduler IP-Core in Electromagnetic Interference Environment. In: 7th IEEE East-West Design & Test Symposium (EWDTS'09), 2009, Moscow, Russia. Proceedings of the 7th IEEE East-West Design & Test Symposium. Los Alamitos Circle CA, USA: IEEE Computer Society, 2009. v. 1.

36. Freijedo, J. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . An Accurate Path Delay Model for Multi-Vdd Dynamic Testing of Digital Circuits. In: 9th IEEE Latin American Test Workshop - LATW´08, 2008, Puebla, Mexico. Proceedings of the 9th IEEE Latin American Test Workshop - LATW´08. Tonantzintla, Puebla, Mexico: Instituto Nacional de Astrofísica, Óptica y Electrónica - INAOE, 2008. v. 1. p. 23-28.

37. Argyrides, C. ; MORAES, Marlon ; VARGAS, F. ; Pradhan, D. K. . Built-in Current Sensor and H-Tree Architecture for SRAM Reliability Improvement. In: 9th IEEE Latin American Test Workshop - LATW´08, 2008, Puebla, Mexico. Proceedings of the 9th IEEE Latin American Test Workshop - LATW´08. Tonantzintla, Puebla, Mexico: Instituto Nacional de Astrofísica, Óptica y Electrónica - INAOE, 2008. v. 1. p. 75-81.

38. SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . A Fault-Tolerant Methodology to Design Power and Thermal Noise-Aware Pipeline Architectures. In: 9th IEEE Latin American Test Workshop - LATW´08, 2008, Puebla, Mexico. Proceedings of the 9th IEEE Latin American Test Workshop - LATW´08. Tonantzintla, Puebla, Mexico: Instituto Nacional de Astrofísica, Óptica y Electrónica - INAOE, 2008. v. 1. p. 121-126.

39. SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. In: 11th IEEE Workshop on Design and Diagnostics of Electronic Systems (DDECS´08), 2008, Bratislava, Slovakia. Proceedings of the 11th IEEE Workshop on Design and Diagnostics of Electronic Systems (DDECS´08). Los Alamitos Cyrcle - CA, USA: IEEE Computer Society, 2008. v. 1.

40. Argyrides, C. ; VARGAS, F. ; MORAES, Marlon ; Pradhan, D. K. . Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement. In: 14th IEEE International On-Line Test Symposium - IOLTS'08, 2008, Rhodes Island, Greece. Proceedings of the IEEE International On-Line Test Symposium - IOLTS'08. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2008. v. 1. p. 155-160.

41. SEMIÃO, Jorge ; Freijedo, J. ; MORAES, Marlon ; Mallmann, M. ; Rocha, C. A. ; Benfica, J. D. ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; ANDINA, Juan José Rodríguez ; TEIXEIRA, João Paulo ; LUPI, Daniel ; GATTI, Edmundo ; GARCÍA, Luis ; HERNANDEZ, Fernando . Power-Supply Instability Aware Clock Signal Modulation for Digital Integrated Circuits. In: IEEE International Symposium on Electromagnetic Compatibility (EMC Europe 2008), 2008, Hamburg, Germany. Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (EMC Europe 2008). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2008. v. 1.

42. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. In: 14th IEEE International On-Line Test Symposium - IOLTS'08, 2008, Rhodes Island, Greece. Proceedings of the 14th IEEE International On-Line Test Symposium - IOLTS'08. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2008. v. 1. p. 227-232.

43. VARGAS, F. ; BENFICA, J. D. ; PICCOLI, Leonardo Bisch ; MORAES, Marlon ; GATTI, Edmundo ; GARCÍA, Luis ; LUPI, Daniel ; HERNANDEZ, Fernando . SoC Prototyping Environment for Electromagnetic Immunity Measurements. In: 1st Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA), 2008, Buenos Aires. Proceedings of the 1st Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA). Los Alamitos Circle, CA - USA: IEEE Computer Society Press, 2008. v. 1. p. 6-10.

44. VARGAS, F. ; Rocha, C. A. ; Cristófoli, L. F. ; Rocha L. . Power-Aware Embedded Software Design. In: IEEE East-West Design and Test Symposium (EWDTS'08), 2008, Lviv, Ukraine. Proceedings of the IEEE East-West Design and Test Symposium (EWDTS'08). Kharkov, Ukraine: SPD FL Stepanov V.V., 2008. v. 1. p. ---.

45. VARGAS, F. ; Rocha, C. A. ; Cristófoli, L. F. ; Rocha L. . Power-Aware Reliable Embedded Software Design. In: 26th Norchip Conference (NORCHP'08), 2008, Tallinn, Estonia. Proceedings of the 26th Norchip Conference (NORCHP'08). H rsholm, DENMARK: Technoconsult ApS, 2008. v. 1. p. ---.

46. SEMIÃO, Jorge ; RODRIGUEZ-IRAGO, Marcial ; PICCOLI, Leonardo Bisch ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; ANDINA, Juan José Rodríguez ; TEIXEIRA, João Paulo . Digital Circuit Signal Integrity Enhancement by Monitoring Power Grid Activity. In: 8th IEEE Latin American Test Workshop - LATW'07, 2007, Cuzco. Proceedings of the 8th IEEE Latin American Test Workshop - LATW'07. Lima, Peru: Pontifícia Universidad Católica del Peru PUCP, 2007. v. 1. p. Session 5-Session 5.

47. RODRIGUEZ-IRAGO, Marcial ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . A Model for the Analytical Definition of Multi-VDD, Multi-T Dynamic Tests in Nanometer Digital Circuits. In: 8th IEEE Latin American Test Workshop - LATW'07, 2007, Cuzco. Proceedings of the 8th IEEE Latin American Test Workshop - LATW'07. Lima, Peru: Pontifícia Universidad Católica del Peru - PUCP, 2007. v. 1. p. Session 3-Session 3.

48. VARGAS, F. ; BENFICA, J. D. ; PICCOLI, Leonardo Bisch ; GATTI, Edmundo ; GARCÍA, Luis ; LUPI, Daniel ; HERNANDEZ, Fernando . Configurable Platform for SoC Electromagnetic Immunity Measurement. In: XIII Workshop IBERCHIP (IBERCHIP'07), 2007, Lima, Peru. Proceedings of the XIII Workshop IBERCHIP. Lima, Peru: Editorial Hozlo SRL, 2007. v. 1. p. 421-422.

49. VARGAS, F. ; PICCOLI, Leonardo Bisch ; BENFICA, J. D. ; ALECRIM JR, Antonio A. de ; MORAES, Marlon . Time-Sensitive Control-Flow Checking for Multitask Operating System-Based SoCs. In: 13th IEEE International On-Line Testing Symposium - IOLTS'07, 2007, Heraklion - Crete, Greece. Proceedings of the 13th IEEE International On-Line Testing Symposium - IOLTS'07. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2007. v. 1. p. 93-98.

50. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. In: 13th IEEE International On-Line Testing Symposium - IOLTS'07, 2007, Heraklion - Crete, Greece. Proceedings of the 13th IEEE International On-Line Testing Symposium - IOLTS'07. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2007. v. 1. p. 167-172.

51. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, João Paulo ; TEIXEIRA, Isabel C . Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. In: IEEE Computer Society Annual International Symposium on VLSI - ISVLSI'07, 2007, Porto Alegre. Proceedings of the IEEE Computer Society Annual International Symposium on VLSI - ISVLSI'07. Los Alamitos Circle, CA - USA: IEEE Computer Society, 2007. v. 1. p. 207-212.

52. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. In: 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'07), 2007, Kraków, Poland. Proceedings of the 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. Los Alamitos Circle, CA - USA: IEEE Computer Society, 2007. v. 1. p. 295-300.

53. SEMIÃO, Jorge ; RODRIGUEZ-IRAGO, Marcial ; MORAES, Marlon ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; ANDINA, Juan José Rodríguez ; TEIXEIRA, João Paulo . System-on-Chip Signal Integrity Enhancement to Power Supply Disturbances. In: 6th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO'07), 2007, Torino, Italy. Proceedings of the 6th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO'07). Los Alamitos Circle, CA - USA: IEEE Computer Society, 2007. v. 1. p. 265-270.

54. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Mixed-Signal Design of Dynamic Delay Buffers to Improve Tolerance to Power Supply and Temperature Variations. In: 13th IEEE International Mixed-Signal Testing Workshop (IMSTW´07), 2007, Póvoa de Varzim. Proceedings of the 13th IEEE International Mixed-Signal Testing Workshop (IMSTW´07). Los Alamitos Circle - CA, USA: IEEE Computer Society, 2007. v. 1. p. 130-135.

55. VARGAS, F. ; Rocha, C. A. ; FARINA, Augusto ; ALECRIM JR, Antonio A. de . Embedded Signature Monitoring Based on Profiling Deployed Software Technique. In: IEEE International East-West Design and Test Symposium (EWDTS´07), 2007, Yerevan, Armenia. Proceedings of the IEEE International East-West Design and Test Symposium (EWDTS´07). Kharkov, Ukraine.: SPD FL Stepanov V.V., 2007. v. 1. p. 230-236.

56. SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. In: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - DFT´07, 2007, Roma, Italy. Proceedings of the 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - DFT´07. Los Alamitos Cyrcle - CA, USA: IEEE Computer Society, 2007. v. 1. p. 303-311.

57. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SEMIÃO, Jorge ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . On the Use of Multi-Clock, Mult-VDD and Multi-Temperature Schemes to Improve Dynamic Fault Detection in Digital Systems. In: 11th IEEE European Test Symposium (ETS`06), 2006, Southampton, United Kingdom. Proceedings of the 11th IEEE European Test Symposium. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2006. v. 1. p. 158-163.

58. VARGAS, F. ; PICCOLI, Leonardo Bisch ; ALECRIM JR, Antonio A. de ; MORAES, Marlon ; GAMA, Márcio . Time-Sensitive Control-Flow Checking Monitoring For Multitask Socs. In: International IEEE East-West Design & Test Workshop (EWDTW 06), 2006, Sochi, Russia. Proceedings of the International IEEE East-West Design & Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society, 2006. v. 1. p. 272-278.

59. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. In: 7th IEEE Latin American Test Workshop - LATW'06, 2006, Buenos Aires, Argentina. Proceedings of the 7th IEEE Latin American Test Workshop. Porto Alegre, Brazil: Editora Evangraf, 2006. v. 1. p. 103-107.

60. VARGAS, F. ; BENFICA, Juliano ; FARINA, Augusto ; BEZERRA, Eduardo ; GATTI, Edmundo ; GARCÍA, Luis ; LUPI, Daniel ; HERNANDEZ, Fernando . Observing SRAM-Based FPGA Robustness in EMI-Exposed Environments. In: 7th IEEE Latin American Test Workshop - LATW'06, 2006, Buenos Aires, Argentina. Proceedings of the 7th IEEE Latin American Test Workshop. Porto Alegre, Brazil: Editora Evangraf, 2006. v. 1. p. 201-206.

61. VARGAS, F. ; PICCOLI, Leonardo Bisch ; ALECRIM JR, Antonio A. de ; MORAES, Marlon ; GAMA, Márcio . Hybrid Solutions for Leveraging SoC Robustness in EMI-Exposed Environments. In: Design & Test of Systems on Chip for EMC Workshop, 2006, Barcelona, Spain. Proceedings of the Design & Test of Systems on Chip for EMC Workshop. Los Alamitos - CA, USA: IEEE EMC Society, 2006. v. único.

62. VARGAS, F. ; BENFICA, Juliano ; FARINA, Augusto ; GATTI, Edmundo ; GARCÍA, Luis ; LUPI, Daniel ; HERNANDEZ, Fernando . Assessing Reconfigurable Systems Robustness in EMI-Exposed Environments. In: EMC Europe 2006, 2006, Barcelona, Spain. Proceedings of the EMC Europe 2006. Los Alamitos - CA, USA: IEEE EMC Society, 2006. v. único.

63. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SEMIÃO, Jorge ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. In: 12th IEEE International On-Line Testing Symposium - IOLTS'06, 2006, Como, Italy. Proceedings of the 12th IEEE International On-Line Testing Symposium. Los Alamitos - CA, USA: IEEE Computer Society, 2006. v. 1.

64. VARGAS, F. ; PICCOLI, Leonardo Bisch ; ALECRIM JR, Antonio A. de ; MORAES, Marlon ; GAMA, Márcio Almeida . Summarizing a Time-Sensitive Control-Flow Checking Monitoring For Multitask SoCs. In: IEEE International Conference on Field Programmable Technology - FPT 06, 2006, Bankok, Thailand. Proceedings of the IEEE International Conference on Field Programmable Technology - FPT 06. Los Alamitos Circle, CA - USA: IEEE Computer Society, 2006. v. 1. p. 249-252.

65. VARGAS, F. ; LOPES, Danniel Cavalcante ; GATTI, Edmundo ; PRESTES, Dárcio Pinto ; LUPI, Daniel ; RHOD, Eduardo Luis . EMI-Based Fault Injection. In: 6th IEEE Latin American Test Workshop - LATW'05, 2005, Salvador - BA, Brazil. Proceedings of the 6th IEEE Latin American Test Workshop - LATW'05. Porto Alegre, Brazil: Editora Evangraf, 2005. v. 1. p. 91-96.

66. BERNARDI, Paolo ; BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . Pandora I-IP: a Hybrid Technique for Control-Flow Checking. In: 6th IEEE Latin American Test Workshop - LATW'05, 2005, Salvador -BA, Brazil. Proceedings of the 6th IEEE Latin American Test Workshop - LATW'05. Porto Alegre, Brazil: Editora Evangraf, 2005. v. 1. p. 123-128.

67. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; BARROS JUNIOR, Daniel ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Using Multiple Clock Schemes and Multi-VDD Test for Dynamic Fault Detection in Digital Circuits. In: 6th IEEE Latin American Test Workshop - LATW'05, 2005, Salvador - BA, Brazil. Proceedings of the 6th IEEE Latin American Test Workshop - LATW'05. Porto Alegre, Brazil: Editora Evangraf, 2005. v. 1. p. 82-87.

68. SILVA, Jarismar Chaves da ; VARGAS, F. ; KLEBER, Luís ; RHOD, Eduardo Luis . Leveraging Dependability of Distributed Systems Based on Software Redundancy & Virtual Reconfiguration. In: XI Workshop IBERCHIP, 2005, Salvador - BA, Brazil. Proceedings of the XI Workshop IBERCHIP. Salvador - BA, Brazil: XI Workshop IBERCHIP, 2005. v. único.

69. VARGAS, F. ; LOPES, Danniel Cavalcante ; GATTI, Edmundo ; PRESTES, Dárcio Pinto ; LUPI, Daniel . On the Proposition of an EMI-Based Fault Injection Approach. In: 11th IEEE International On-Line Testing Symposium - IOLTS'05, 2005, Saint-Raphael, France. Proceedings of the 11th IEEE International On-Line Testing Symposium - IOLTS'05. Los Alamitos - CA, USA: IEEE Computer Society, 2005. v. 1. p. 207-208.

70. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. In: 11th IEEE International On-Line Testing Symposium - IOLTS'05, 2005, Saint-Raphael, France. Proceedings of the 11th IEEE International On-Line Testing Symposium - IOLTS'05. Los Alamitos Circle - CA, USA: IEEE Comptuer Society, 2005. v. 1. p. 281-286.

71. BERNARDI, Paolo ; BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . On-line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. In: Dependable Computing Communications Symposium - DCCS'05, 2005, Yocohama - Japan. Proceedings of the Dependable Computing Communications Symposium - DCCS'05. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2005. v. 1.

72. RODRIGUEZ-IRAGO, Marcial ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Multiple-Clock and Multi-VDD Schemes for Dynamic fault detection in Nanometer Digital Circuits. In: XX Conference on Design of Circuits and Integrated Circuits - DCIS'05, 2005, Lisboa. Proceedings of the XX Conference on Design of Circuits and Integrated Circuits - DCIS'05. Lisboa, Portugal: INESC-ID, Univ. de Lisboa, 2005. v. único. p. 136-136.

73. VARGAS, F. ; LOPES, Danniel Cavalcante ; SILVA, Jarismar Chaves da ; BARROS JUNIOR, Daniel . EMI-Induced Soft-Error Rate Estimates for COTS Microprocessor. In: 5th IEEE Latin American Test Workshop - LATW'04, 2004, Cartagena, Colômbia. Proceedings of the 4th IEEE Latin American Test Workshop - LATW'03. Los Alamitos - CA, USA: IEEE Computer Society, 2004. v. único. p. 169-172.

74. BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . An Infrastructure IP for Soft Error Detection. In: 5th IEEE Latin American Test Workshop - LATW'04, 2004, Cartagena, Colômbia. Proceedings of the 5th IEEE Latin American Test Workshop - LATW'04. Los Alamitos - CA, USA: IEEE Computer Society, 2004. v. único. p. 164-168.

75. VARGAS, F. ; HERNANDEZ, Fernando ; GARCÍA, Luis ; PRESTES, Dárcio Pinto . Integrating Latin American R&D Groups Around EMI Std-Compliance Test Equipments and Setup Procedures. In: X Workshop IBERCHIP, 2004, Cartagena, Colômbia. Proceedings of the 10th IBERCHIP. Cartagena, Colômbia: X Workshop IBERCHIP, 2004. v. único. p. 88-88.

76. HERNANDEZ, Fernando ; VARGAS, F. ; GARCÍA, Luis ; LOPES, Danniel Cavalcante ; PRESTES, Dárcio Pinto ; LUPI, Daniel . Microprocessor Error Rate Estimation Based on IC International Standards. In: EMC Europe 2004, 2004, Eindhoven, The Netherlands. IEEE EMC Society - Proceedings of the EMC Europe 2004. Los Alamitos Circle, CA - USA: IEEE Computer Society Press, 2004. v. único.

77. BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . Hybrid Soft Error Detection by means of Infrastructure IP cores. In: 10th IEEE International On-Line Testing Symposium - IOLTS'04, 2004, Madeira Island, Portugal. Proceedings of the 10th IEEE International On-Line Testing Symposium - IOLTS'04. Los Alamitos - CA, USA: IEEE Computer Society Press, 2004. v. 1. p. 79-84.

78. BARROS JUNIOR, Daniel ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Modeling and Simulation of Time Domain Faults in Digital Systems. In: 10th IEEE International On-Line Testing Symposium - IOLTS'04, 2004, Madeira Island, Portugal. Proceedings of the 10th IEEE International On-Line Testing Symposium - IOLTS'04. Los Alamitos - CA, USA: IEEE Computer Society Press, 2004. v. 1. p. 5-10.

79. RODRIGUEZ-IRAGO, Marcial ; BARROS JUNIOR, Daniel ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Modeling of Power Supply Transients for EMI Compliance in Digital Systems. In: 10th IEEE International Mixed-Signal Testing Workshop - IMSTW'04, 2004, Portland-Oregon, USA. Proceedings of the 10th IEEE International Mixed-Signal Testing Workshop - IMSTW'04. Los Alamitos - CA, USA: IEEE Computer Society Press, 2004. v. único. p. 169-177.

80. BERNARDI, Paolo ; BOLZANI, Letícia ; REBAUDENGO, Mauricio ; REORDA, Matteo Sonza ; VARGAS, F. ; VIOLANTE, Massimo . Cerberus I-IP: an HW/SW approach to Control Flow Checking. In: 2nd IEEE International Workshop on Infrastructure IP (I-P'04), 2004, Charlotte - NC, USA. Proceedings of the 2nd IEEE International Workshop on Infrastructure IP - I-P'04. Los Alamitos Circle - CA, USA: IEEE Computer Society, 2004. v. único.

81. VARGAS, F. ; BRUM, Diogo Becker de ; PRESTES, Dárcio Pinto ; BOLZANI, Letícia ; LETTNIN, D. V. . On the Mitigation of Conducted Electromagnetic Immunity by Means of SW-Based Fault Handling Mechanisms. In: 4th IEEE Latin American Test Workshop - LATW'03, 2003, Natal, RN. Proceedings of the 4th IEEE Latin American Test Workshop - LATW'03. Los Alamitos - CA, USA: IEEE Computer Society Press, 2003. v. único. p. 130-135.

82. VARGAS, F. ; BRUM, Diogo Becker de ; PRESTES, Dárcio Pinto ; BOLZANI, Letícia ; LETTNIN, D. V. ; RODRIGUES, G. M. . On the Study of the Effectiveness of SW-Based Fault Handling Mechanisms to Cope with IC Conducted Electromagnetic Interference. In: IX Workshop IBERCHIP, 2003, La Havana, Cuba. Proceedings of the IX Workshop IBERCHIP. La Havana, Cuba: IX Workshop IBERCHIP, 2003. v. único. p. 73-73.

83. VARGAS, F. ; BRUM, Diogo Becker de ; PRESTES, Dárcio Pinto ; BOLZANI, Letícia ; RHOD, Eduardo Luis ; REORDA, Matteo Sonza . Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: are they a good remedy?. In: 9th IEEE Internacional On-Line Testing Symposium - IOLTS'03, 2003, Kos Island, Greece. Proceedings of the 9th Internacional On-Line Test Symposium - IOLTS'03. Los Alamitos - CA, USA: IEEE Computer Society Press, 2003. v. único. p. 163-163.

84. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel ; BRUM, Diogo Becker de . Briefing a New Approach to Improve the EMI Immunity of DSP Systems. In: 12th IEEE Asian Test Symposium - ATS'03, 2003, Xian, China. Proceedings of the 12th IEEE Asian Test Symposium - ATS'03. Los Alamitos Circle - CA, USA: IEEE Computer Society Press, 2003. v. único. p. 468-471.

85. VARGAS, F. ; LOPES, Danniel Cavalcante ; BRUM, Diogo Becker de ; SILVA, Jarismar Chaves da ; BARROS JUNIOR, Daniel . Preliminary Study Towards the EMI-Induced Bit-Flips Prediction for COTS Microprocessors. In: 4th IEEE Workshop on RTL and High Level Testing - WRTLT'03, 2003, Xian, China. Proceedings of the 4th IEEE Workshop on RTL and High Level Testing - WRTLT'03. Xian, China: 4th IEEE Workshop on RTL and High Level Testing - WRTLT'03, 2003. v. único. p. 222-225.

86. VARGAS, F. ; LUPI, Daniel ; HERNANDEZ, Fernando ; GARCÍA, Luis ; MEDINA, Jaime Velasco ; SILVA, Ferran ; QUILEZ, Marcos ; GALVÃO, Benjamim Silva . Controlling EMC Performance in Electronic Circuits: a Conducted Immunity Test Method. In: IX Workshop IBERCHIP, 2003, La Havana. Proceedings of the IX Workshop IBERCHIP. La Havana, Cuba: IX Workshop IBERCHIP, 2003. v. único. p. 117-117.

87. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. In: IEEE International Telecommunications Symposium - ITS'02, 2002, Natal - Brazil. Proceedings of the IEEE International Telecommunications Symposium. Los Alamitos, CA - USA: IEEE Computer Society, 2002. v. único.

88. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Summarizing a New Approach to Design Reliable Speech Recognition Systems. In: 7th IEEE European Test Workshop - ETW'02, 2002, Corfu, Greece. Proceedings of the 7th IEEE European Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society, 2002. v. único.

89. VARGAS, F. ; LETTNIN, D. V. ; MACARTHY, M. . Estudo de um Sistema para Classificação de Batimentos Cardíacos Utilizando Redes Neurais. In: VIII Workshop IBERCHIP, 2002, Guadalajara, Mexico. Proceedings of the VIII Workshop IBERCHIP. Guadalajara, Mexico: VIII Workshop IBERCHIP, 2002. v. único. p. 83-84.

90. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. In: 3rd IEEE Latin American Test Workshop - LATW'02, 2002, Montevideo, Uruguay. Proceedings of the 3rd IEEE Latin American Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society Press, 2002. v. único. p. 04-10.

91. VARGAS, F. ; LETTNIN, D. V. ; CASTRO, Maria Cristina Felippetto de ; MACARTHY, M. . Electrocardiogram Pattern Recognition by Means of MLP Network and PCA: A Case Study on Equal Amount of Input Signal Types. In: VII Brazilian Symposium on Neural Networks - SBRN'02, 2002, Recife, Brazil. Proceedings of the VII Brazilian Symposium on Neural Networks. Los Alamitos - CA, USA: IEEE Computer Society, 2002. v. único.

92. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Last Improvements on the Design of Noise-Immune Speech Recognition Systems. In: 11th IEEE Asian Test Symposium - ATS'02, 2002, Guam, USA. Proceedings of the 11th IEEE Asian Test Symposium - ATS'02. Los Alamitos - CA, USA: IEEE Computer Society, 2002. v. único.

93. VARGAS, F. ; LETTNIN, D. V. ; BRUM, Diogo Becker de ; PRESTES, Dárcio Pinto . A New Learning Approach to Design Fault Tolerant ANNs: Finally a Zero HW-SW Overhead. In: 11th IEEE Asian Test Symposium - ATS'02, 2002, Guam, USA. Proceedings of the 11th IEEE Asian Test Symposium - ATS'02. Los Alamitos - CA, USA: IEEE Computer Society, 2002. v. único.

94. VARGAS, F. ; AMORY, A. . Circuit Modeling and Fault Injection Approach to Predict SEU Rate and MTTF in Complex Circuits. In: 2nd IEEE Latin-American Test Workshop - LATW2001, 2001, Cancun, Mexico. Proceedings of the 2nd IEEE Latin-American Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society Press, 2001. v. único. p. 06-12.

95. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Orienting Redundancy and HW/SW Codesign Techniques Towards Speech Recognition Systems. In: 2nd IEEE Latin American Test Workshop - LATW2001, 2001, Cancun, Mexico. Proceedings of the 2nd IEEE Latin American Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society Press, 2001. v. único. p. 226-233.

96. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . A FPGA-Based Viterbi Algorithm Implementation for Speech Recognition Systems. In: IEEE International Conference on Acoustics, Speech and Signal Processing - ICASSP2001, 2001, Salt Lake City, Utah - USA. Proceedings of the IEEE International Conference on Acoustics, Speech and Signal Processing. Los Alamitos - CA, USA: IEEE Computer Society Press, 2001. v. único. p. 184-184.

97. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Orienting Redundancy and HW/SW Codesign Techniques Towards Speech Recognition Systems: Preliminary Results. In: IX Brazilian Symposium on Fault-Tolerant Computing - SCTF, 2001, Florianópolis - SC, Brazil. Procedings of the IX Brazilian Symposium on Fault-Tolerant Computing - SCTF. Campinas - SP, Brazil: Editora UNICAMP, 2001. v. único. p. 114-122.

98. VARGAS, F. ; AMORY, A. . A Low-Cost and Fast Approach to Predict SEU Rate and MTTF in Complex Circuits. In: IX Brazilian Symposium on Fault-Tolerant Computing - SCTF, 2001, Florianópolis - SC, Brazil. Proceedings of the IX Brazilian Symposium on Fault-Tolerant Computing. Campinas - SP, Brazil: Editora UNICAMP, 2001. v. único. p. 21-30.

99. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . SCORPION: A New Approach to Design Real-Time Speech Recognition Systems. In: VII Workshop IBERCHIP, 2001, Montevideo, Uruguay. Proceedings of the VII Workshop IBERCHIP. Montevideo, Uruguay: VII Workshop IBERCHIP, 2001. v. único. p. 64-74.

100. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . A New Approach to Design Real-Time Speech Recognition Systems. In: 7th IEEE International On-Line Testing Workshop - IOLTW'01, 2001, Taormina, Italy. Proceedings of the 7th IEEE International On-Line Testing Workshop. Los Alamitos - CA, USA: IEEE Computer Society, 2001. v. único. p. 187-191.

101. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Summarizing a New Approach to Design Speech Speech Recognition Systems: A Reliable Noise-Immune HW-SW Version. In: 14th Symposium on Integrated Circuits and Systems Design - SBCCI'01, 2001, Pirenópolis, Brazil. Proceedings of the 14th Symposium on Integrated Circuits and Systems Design. Los Alamitos - CA, USA: IEEE Computer Society, 2001. v. único. p. 109-114.

102. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Speech Recognition Systems: from a Conventional SW Implementation to a Reliable Noise-Immunity HW-SW Version. In: XIX Simpósio Brasileiro de Telecomunicações - SBT2001, 2001, Fortaleza, Brasil. Anais do XIX Simpósio Brasileiro de Telecomunicações. Fortaleza, Brasil: Sociedade Brasileira de Telecomunicações - SBrT, 2001. v. único.

103. FAGUNDES, Rubem Dutra Ribeiro ; VARGAS, F. ; BARROS JUNIOR, Daniel . Introducing a FPGA-Based Viterbi Algorithm for Speech Recognition Systems. In: International Association of Science and Technology for Development (IASTED) International Conference on Signal Processing, Pattern Recognition & Applications, 2001, Rhodes, Greece. Proceedings of the IASTED International Conference on Signal Processing, Pattern Recognition & Applications. Anaheim - CA, USA: ACTA Press, Anaheim - CA, USA, 2001. v. único. p. 226-229.

104. VARGAS, F. ; AMORY, A. ; VELAZCO, R. . Fault-Tolerance in VHDL Description: Transient-Fault Injection & Early Reliability Estimation. In: 1st IEEE Latin American Test Workshop - LATW'00, 2000, Rio de Janeiro, Brazil. Proceedings of the 1st IEEE Latin American Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society, 2000. v. único. p. 29-35.

105. BEZERRA, Eduardo ; VARGAS, F. ; GOUGH, M. P. . Merging BIST and Configurable Computing Technology to Improve Availability in Space Applications. In: 1st IEEE Latin American Test Workshop - LATW'00, 2000, Rio de Janeiro, Brazil. Proceedings of the 1st IEEE Latin American Test Workshop. Los Alamitos - CA, USA: IEEE Computer Society, 2000. v. único. p. 146-151.

106. VARGAS, F. ; AMORY, A. ; VELAZCO, R. . Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL . In: 6th International On-Line Testing Workshop - IOLTW'00, 2000, Mallorca, Spain. Proceedings of the 6th International On-Line Testing Workshop - IOLTW'00. Los Alamitos - CA, USA: IEEE Computer Society, 2000. v. único. p. 67-72.

107. VARGAS, F. ; VELAZCO, R. . Transient-Fault Injection in VHDL Description: Towards Fault-Tolerance Early Estimation . In: VI Workshop IBERCHIP, 2000, Sao Paulo, Brazil. Proceedings of the VI Workshop IBERCHIP. Sao Paulo, Brazil: VI Workshop IBERCHIP, 2000. v. único. p. 261-270.

108. VARGAS, F. ; AMORY, A. . Recent Improvements on the Specification of Transient-Fault Tolerant VHDL Descriptions: A Case-Study for Area Overhead Analysis . In: XIII Symposium on Integrated Circuits and Systems Design - SBCCI'00, 2000, Manaus - AM, Brazil. Proceedings of the XIII Symposium on Integrated Circuits and Systems Design - SBCCI'00. Los Alamitos - CA, USA: IEEE Computer Society, 2000. v. único. p. 249-254.

109. VARGAS, F. ; AMORY, A. . Transient-Fault Tolerant VHDL Descriptions: A Case-Study for Area Overhead Analysis. In: 9th IEEE Asian Test Symposium - ATS'00, 2000, Taipei, Taiwan. Proceedings of the 9th IEEE Asian Test Symposium - ATS'00. Los Alamitos - CA, USA: IEEE Computer Society, 2000. v. Único. p. 417-422.

110. FAGUNDES, Rubem Dutra Ribeiro ; VARGAS, F. ; BARROS JUNIOR, Daniel . A Viterbi Algorithm Implementation Using Hardware/Software Co-Design in Speech Recognition Systems. In: The International Association of Science and Technology for Development Conference - IASTED 2000, 2000, Marbella, Spain. Proceedings of the The International Association of Science and Technology for Development Conference - IASTED 2000. Anaheim - CA, USA: IASTED/ACTA Press, 2000. v. único. p. 205-209.

111. VARGAS, F. ; AMORY, A. . Desgin of SEU-Tolerant Processors for Radiation-Exposed Systems. In: 4th IEEE International High Level Design Validation and Test Workshop - HLDVTW'99, 1999, San Diego - California, USA. Proceedings of the 4th IEEE International High Level Design Validation and Test Workshop - HLDVTW'99. Los Alamitos - CA, USA: IEEE Computer Society, 1999. v. único. p. 110-116.

112. VARGAS, F. ; NICOLAIDIS, M. . Criteria for Static Current Estimation: How Good Are They? An Approach Incorporating IC Quality Requirements. In: XII Symposium on Integrated Circuits and Systems Design - SBCCI'99, 1999, Natal - RN, Brazil. Proceedings of the XII Symposium on Integrated Circuits and Systems Design - SBCCI'99. Los Alamitos - CA, USA: IEEE Computer Society, 1999. v. único. p. 170-173.

113. BEZERRA, Eduardo ; OZCERIT, A. ; VARGAS, F. ; GOUGH, M. P. . Improving the Dependability of Embedded Systems Using Configurable Computing Technology. In: 14th International Symposium on Computer and Information Sciences - ISCIS'99, 1999, Kusadasi, Turkey. Proceedings of the 14th International Symposium on Computer and Information Sciences - ISCIS'99. Los Alamitos - CA, USA: IEEE Computer Society, 1999. v. único.

114. VARGAS, F. ; BEZERRA, Eduardo ; WULFF, L. ; BARROS JUNIOR, Daniel . Estimating Testability on Digital Systems Based on Weak Mutation Analysis: Preliminary Simulation Reuslts. In: XIV International Conference on Microelectronics and Packaging - ICMP'99, 1999, Campinas - SP, Brazil. Proceedings of the XIV International Conference on Microelectronics and Packaging - ICMP'99. Campinas - SP, Brazil: XIV International Conference on Microelectronics and Packaging - ICMP'99, 1999. v. único. p. 58-63.

115. VARGAS, F. ; TERROSO, A. R. . Estimating Testability on Digital Systems Based on Weak Mutation Analysis: Preliminary Simulation Results. In: 5th IEEE International On-Line Testing Workshop - IOLTW'99, 1999, Rhodes, Greece. Proceedings of the 5th IEEE International On-Line Testing Workshop - IOLTW'99. Rhodes, Greece: 5th IEEE International On-Line Testing Workshop - IOLTW'99, 1999. v. único. p. 200-205.

116. VARGAS, F. ; BEZERRA, Eduardo ; TERROSO, A. R. . Testability Verification of Embedded Systems Based on Weak Mutation Analysis. In: 3rd IEEE International Workshop on Testing Embedded Core-Based System-Chips -TECS'99, 1999, Dana Point - CA, USA. Proceedings of the 3rd IEEE International Workshop on Testing Embedded Core-Based System-Chips -TECS'99. Dana Point - CA, USA: 3rd IEEE International Workshop on Testing Embedded Core-Based System-Chips -TECS'99, 1999. v. único. p. 31-37.

117. VARGAS, F. ; BEZERRA, Eduardo ; WULFF, L. ; BARROS JUNIOR, Daniel . Reliability-Oriented HW/SW Partitioning Approach. In: 4th IEEE International On-Line Testing Workshop - IOLTW'98, 1998, Capri, Italy. Proceedings of the 4th IEEE International On-Line Testing Workshop - IOLTW'98. Capri: 4th IEEE International On-Line Testing Workshop - IOLTW'98, 1998. v. único. p. 17-22.

118. VARGAS, F. ; BEZERRA, Eduardo ; TERROSO, A. R. ; BARROS JUNIOR, Daniel . Reliability Verification of Fault-Tolerant Systems Design Based on Mutation Analysis. In: XI Brazilian Symposium on Integrated Circuit Design - SBCCI'98, 1998, Rio de Janeiro - RJ, Brasil. Proceedings of the XI Brazilian Symposium on Integrated Circuit Design - SBCCI'98. Los Alamitos - CA, USA: IEEE Computer Society, 1998. v. único. p. 55-58.

119. VARGAS, F. ; BEZERRA, Eduardo ; WULFF, L. ; BARROS JUNIOR, Daniel . Reliability-Oriented HW-SW Partitioning & Verification for Critical-Application Systems. In: XIII International Conference on Microelectronics and Packaging - ICMP'98, 1998, Curitiba - PR, Brazil. Proceedings of the XIII International Conference on Microelectronics and Packaging - ICMP'98. Curitiba - PR, Brazil: XIII International Conference on Microelectronics and Packaging - ICMP'98, 1998. v. 1. p. 85-92.

120. VARGAS, F. ; BEZERRA, Eduardo ; WULFF, L. ; BARROS JUNIOR, Daniel . Optimizing HW/SW Codesign Towards Reliability for Critical-Application Systems. In: 7th IEEE Asian Test Symposium - ATS'98, 1998, Singapure City - Singapure. Proceedings of the 7th IEEE Asian Test Symposium - ATS'98. Los Alamitos - CA, USA: IEEE Computer Society, 1998. v. único. p. 52-57.

121. VARGAS, F. ; NICOLAIDIS, M. . Criteria for Static Current Estimation: How Good Are They? An Approach Incorporating IC Quality Requirements. In: IV Workshop IBERCHIP, 1998, Mar del Plata, Argentina. Proceedings of the IV Workshop IBERCHIP. Mar del Plata, Argentina: IV Workshop IBERCHIP, 1998. v. único. p. 365-374.

122. VARGAS, F. ; MORAES, F. G. ; CALAZANS, N. L. ; BEZERRA, Eduardo . HARDSOFT: Plataforma Reconfigurável para Caracterização Sob Radiação de Componentes Eletrônicos Embarcados em Satélites. In: VII Simpósio de Computadores Tolerantes a Falhas - VII SCTF, 1997, Campina Grande - PE, Brasil. Anais do VII Simpósio de Computadores Tolerantes a Falhas - VII SCTF. Campina Grande: VII Simpósio de Computadores Tolerantes a Falhas - VII SCTF, 1997. v. único. p. 139-152.

123. VARGAS, F. ; VELAZCO, R. ; TERROSO, A. R. ; BARROS JUNIOR, Daniel . On the Improvement of Radiation-Tolerant Systems Through Current Monitoring: A Case Study. In: XII Conference of The Brazilian Microelectronics Society - SBMicro'97, 1997, Caxambú - MG, Brasil. Proceedings of the XII Conference of The Brazilian Microelectronics Society - SBMicro'97. Caxambú: XII Conference of The Brazilian Microelectronics Society - SBMicro'97, 1997. v. único.

124. BEZERRA, Eduardo ; VARGAS, F. ; PORTO, Ingrid Jansch ; KITAJIMA, J. P. . Improving Transputer Internal Memory Reliability with Transparent Test: Case Study and Performance Analysis. In: IFAC Symposium on Fault Detection, Supervision and Safety for Technical Processes: SAFEPROCESS'97, 1997, Hull, United Kingdom. Proceedings of the IFAC Symposium on Fault Detection, Supervision and Safety for Technical Processes: SAFEPROCESS'97. Hull, United Kingdom: IFAC Symposium on Fault Detection, Supervision and Safety for Technical Processes: SAFEPROCESS'97, 1997. v. 2. p. 609-614.

125. VARGAS, F. ; VELAZCO, R. ; NICOLAIDIS, M. ; ZORIAN, Y. . Improving System Fault-Tolerance Through Board-Level Current Monitoring. In: 3rd IEEE International On-Line Testing Workshop - IOLTW'97, 1997, Crete, Greece. Proceedings of the 3rd IEEE International On-Line Testing Workshop - IOLTW'97. Crete, Greece: 3rd IEEE International On-Line Testing Workshop - IOLTW'97, 1997. v. único. p. 84-88.

126. VARGAS, F. ; VELAZCO, R. ; TERROSO, A. R. . Performance Improvement of Reconfigurable Systems Through Chip-Level Current Monitoring. In: III Workshop IBERCHIP, 1997, Mexico City, Mexico. Proceedings of the III Workshop IBERCHIP. Mexico City, Mexico: III Workshop IBERCHIP, 1997. v. único.

127. VARGAS, F. ; VELAZCO, R. ; AMARAL, J. N. ; CALAZANS, N. L. . Radiation Effects on Electronic Devices: the Need for Ground Tests. In: IX Brazilian Symposium on Integrated Circuits Design - I Brazilian Workshop on Hardware/Software Codesign, 1996, Recife - PE, Brasil. Proceedings of the IX Brazilian Symposium on Integrated Circuits Design - I Brazilian Workshop on Hardware/Software Codesign. Recife: IX Brazilian Symposium on Integrated Circuits Design - I Brazilian Workshop on Hardware/Software Cod, 1996. v. único. p. 105-116.

128. BEZERRA, Eduardo ; VARGAS, F. ; PORTO, Ingrid Jansch . Implementing Transparent BIST for Transputer Embedded Memory. In: XI Conference of The Brazilian Microelectronics Society - SBMicro, 1996, Águas de Lindóia - MG, Brasil. Proceedings of the XI Conference of The Brazilian Microelectronics Society - SBMicro. Águas de Lindóia: XI Conference of The Brazilian Microelectronics Society - SBMicro, 1996. v. único. p. 141-146.

129. VARGAS, F. . A Dynamic Power Management Technique Based on Built-In Current Sensors. In: XI Conference of The Brazilian Microelectronics Society - SBMicro'96, 1996, Águas de Lindóia - MG, Brasil. Proceedings of the XI Conference of The Brazilian Microelectronics Society - SBMicro'96. Águas de Lindóia: XI Conference of The Brazilian Microelectronics Society - SBMicro'96, 1996. v. único. p. 49-54.

130. PAULA JUNIOR, A. ; SATURNO, M. ; VARGAS, F. ; VELAZCO, R. . A Strategy Allowing to Use Commercial Circuits in Mass Memory of Micro-Satellites. In: IEEE International Workshop on CAD, Test and Evaluation for Dependability, 1996, Beijing, China. Proceedings of the IEEE International Workshop on CAD, Test and Evaluation for Dependability. Beijing, China: International Academic Publishers, 1996. v. único. p. 293-296.

131. VARGAS, F. ; CALIN, T ; NICOLAIDIS, M. . Towards Low-Cost Highly-Reliable SEU-Tolerant SRAMs: Real Case Study & Test Results. In: II Workshop IBERCHIP, 1996, Sao Paulo - SP, Brazil. Proceedings of the II Workshop IBERCHIP. Sao Paulo - SP, Brazil: II Workshop IBERCHIP, 1996. v. único. p. 365-374.

132. CALIN, T. ; VARGAS, F. ; NICOLAIDIS, M. ; VELAZCO, R. . A Low-Cost High Reliability SEU-Tolerant SRAM Design: Prototype and Test Results. In: 32nd Nuclear and Space Radiation Effects Conference - NSREC'95, 1995, Wisconsin, USA, 1995.

133. VARGAS, F. ; NICOLAIDIS, M. ; ZORIAN, Y. . Design of Total-Dose Tolerant MCMs Based on Current Monitoring. In: 1st IEEE International On-Line Testing Workshop - IOLTW'95, 1995, Nice, France. Proceedings of the 1st IEEE International On-Line Testing Workshop - IOLTW'95. Nice, France: 1st IEEE International On-Line Testing Workshop - IOLTW'95, 1995. v. único.

134. VARGAS, F. ; NICOLAIDIS, M. . SEU-Tolerant SRAM Design Based on Iddq Monitoring for Spacecraft Electronics. In: X Conference of the Brazilian Microelectronics Society - I Ibero American Microelectronics Conference, 1995, Canela - RS, Brazil. Proceedings of the X Conference of the Brazilian Microelectronics Society - I Ibero American Microelectronics Conference. Canela - RS, Brazil: X Conference of the Brazilian Microelectronics Society - I Ibero American Microelectronics Conferenc, 1995. v. 1. p. 271-280.

135. CALIN, T. ; VARGAS, F. ; NICOLAIDIS, M. . Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. In: International Test Conference - ITC 95, 1995, Washington, USA. Proceedings of the International Test Conference - ITC 95. Los Alamitos - CA, USA: IEEE Computer Society, 1995. v. único. p. 45-53.

136. VARGAS, F. ; NICOLAIDIS, M. ; ZORIAN, Y. . An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. In: International Test Conference - ITC 95, 1995, Washington, USA. Proceedings of the International Test Conference - ITC 95. Los Alamitos - CA, USA: IEEE Computer Society, 1995. v. 1. p. 345-354.

137. VARGAS, F. ; DUARTE, R. O. ; NICOLAIDIS, M. . A Current Testing Technique to Improve IC Quality Requirements. In: XIV Conference of the Brazilian Computer Society - SBC, 1994, Caxambú - MG, Brasil. Proceedings of the XIV Conference of the Brazilian Computer Society - SBC. Caxambú: XIV Conference of the Brazilian Computer Societ - SBC, 1994. v. único.

138. VARGAS, F. ; NICOLAIDIS, M. . SEU-Tolerant SRAM Design Based on Current Monitoring. In: 24th FTCS - International Symposium on Fault-Tolerant Computing, 1994, Austin - TX, USA. Proceedings of the 24th FTCS - International Symposium on Fault-Tolerant Computing. Los Alamitos - CA, USA: IEEE Computer Society, 1994. v. 1. p. 106-115.

139. VARGAS, F. ; NICOLAIDIS, M. ; HAMDI, B. . Quiescent Current Estimation Based on Quality Requirements. In: 11th IEEE VLSI Test Symposium - VTS'93, 1993, Atlantic City, USA. Proceedings of the 11th IEEE VLSI Test Symposium - VTS'93. Los Alamitos - CA, USA: IEEE Computer Society, 1993. v. único. p. 33-39.

140. VARGAS, F. ; NICOLAIDIS, M. ; COURTOIS, B. . Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Environments. In: International Conference on Computer Design - ICCD'93, 1993, Cambridge - MA, USA. Proceedings of the International Conference on Computer Design - ICCD'93. Los Alamitos - CA, USA: IEEE Computer Society, 1993. v. único. p. 596-600.

141. NICOLAIDIS, M. ; VARGAS, F. ; COURTOIS, B. . Design of Reliable Current Sensors for Radiation Exposed Environments. In: 30th Annual International Nuclear and Space Radiation Effects Conference - NSREC'93, 1993, Snowbird - Utah, USA, 1993.

142. VARGAS, F. ; NICOLAIDIS, M. . Current Testing for ICs Used in Space Applications. In: Workshop on Current Testing, 1992, Barcelona, Spain, 1992.

143. MARZOUKI, M. ; VARGAS, F. . Debugging Prototype Circuits Using a Knowledge-Based Approach: A Case Study. In: VI Conference of the Brazilian Microeletronics Society - SBMicro, 1991, Belo Horizonte - MG, Brasil. Proceedings of the VI Conference of the Brazilian Microeletronics Society - SBMicro. Belo Horizonte: Conference of the Brazilian Microeletronics Society - SBMicro, 1991. v. único. p. 517-526.

144. RUSSEL, J. D. ; VARGAS, F. ; COURTOIS, B. . E-Beam Testing Using Multiple Adjacent Image Processing for Prototype Validation. In: 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits, 1991, Como, Italy. Proceedings of the 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits. Los Alamitos - CA, USA: IEEE Computer Society, 1991. v. único. p. 413-420.

145. MARZOUKI, M. ; VARGAS, F. . Using a Knowledge-Based System for Automatic Debugging: Case Study and Performance Analysis. In: 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits, 1991, Como, Italy. Proceedings of the 3rd European Conference on Electron and Optical Beam Testing of Integrated Circuits. Los Alamitos - CA, USA: IEEE Computer Society, 1991. v. único. p. 129-136.

146. MARZOUKI, M. ; VARGAS, F. . Knowledge-Based Debugging of ASICs: Real Case Study and Performance Analysis. In: International Conference on Computer Aided Design - ICCAD'91, 1991, Santa Clara - CA, USA. Proceedings of the International Conference on Computer Aided Design - ICCAD'91. Los Alamitos - CA, USA: IEEE Computer Society, 1991. v. único. p. 198-201.

147. JUNQUEIRA, A. A. ; SUZIM, Altamiro Amadeu ; MARCON, C. A. M. ; VARGAS, F. ; BASTOS, R. M. R. ; WAGNER, T. V. . RISCO - A 32-Bit CMOS RISC Microprocessor. In: V Brazilian Symposium on Integrated Circuit Design - SBCCI, 1990, Ouro Preto - MG, Brasil. Proceedings of the V Brazilian Symposium on Integrated Circuit Design - SBCCI. Ouro Preto: Brazilian Symposium on Integrated Circuit Design - SBCCI, 1990. v. único. p. 143-155.

148. REIS, A. ; VARGAS, F. ; MORAES, F. G. ; REIS, R. A. L. . Teste, Depuração e Resultados de um Circuito Codificador/Decodificador para Modens. In: V Conference of the Brazilian Microelectronics Society - SBMicro, 1990, Campinas - SP, Brasil. Proceedings of the V Conference of the Brazilian Microelectronics Society - SBMicro. Campinas: Conference of the Brazilian Microelectronics Society - SBMicro, 1990. v. único. p. 266-273.

 

Expanded Summary published in proceedings of conferences:

1. VARGAS, F. ; Rocha, C. A. ; FARINA, Augusto . Power, Performance and Memory Overhead-Aware Checkpoint Insertion Based on Profiling Deployed Software. In: 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR, 2008, Verbania, Lago Maggiore, Italy. Digest of Papers of the 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR. Torino, Italy: Politecnico di Torino, 2008. v. 1. p. Paper 9.

2. Freijedo, J. ; SEMIÃO, Jorge ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; TEIXEIRA, João Paulo ; TEIXEIRA, Isabel C . Delay Modeling for Power Noise-Aware Design and Test of Nanometer Digital Circuits. In: 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR, 2008, Verbania, Lago Maggiore, Italy. Digest of Papers of the 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR. Torino, Italy: Politecnico di Torino, 2008. v. 1. p. Paper 17.

3. SEMIÃO, Jorge ; Freijedo, J. ; ANDINA, Juan José Rodríguez ; VARGAS, F. ; SANTOS, Marcelino B ; TEIXEIRA, Isabel C ; TEIXEIRA, João Paulo . Power and Time Management for Low-Power Design. In: 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR, 2008, Verbania, Lago Maggiore, Italy. Digest of Papers of the 1st IEEE International Workshop on the Impact of Low Power Design on Test and Reliability - LPonTR. Torino, Italy: Politecnico di Torino, 2008. v. 1. p. Paper 23.

4. VARGAS, F. ; Rocha, C. A. ; ALECRIM JR, Antonio A. de ; BECKER, Carlos André . Embedded Signature Insertion Based on Profiling Deployed Software Technique. In: XIII Workshop IBERCHIP (IBERCHIP'07), 2007, Lima, Peru. Proceedings of the XIII Workshop IBERCHIP. Lima, Peru: Editorial Hozlo SRL, 2007. v. 1. p. 423-424.

5. BEZERRA, Eduardo ; VARGAS, F. ; GOUGH, M. P. . Sig-FPGA: A Signature Analysis Based Strategy for On-line Testing/Recovering of Reconfigurable Computer Systems. In: DATE'2001 - Design, Automation and Test in Europe, 2001, Munique. Proceedings of the DATE'2001 - Design, Automation and Test in Europe. Los Alamitos - CA, USA: IEEE Computer Society Press, 2001. v. único.

 

Technological Products:

1. VARGAS, F. ; BENFICA, J. D. . Sistema para Armazenamento de Grãos, e, Processo para Secagem de Grãos. 2010.

2. VARGAS, F. ; PRESTES, Dárcio Pinto . Gerador Parametrizável de Ruído Eletromagnético Conduzido para Teste de Circuitos Integrados. 2007.

3. VARGAS, F. ; FAGUNDES, Rubem Dutra Ribeiro ; BARROS JUNIOR, Daniel . Sistema para Reconhecimento de Voz Através de Arquitetura Heterogênea (HW-SW). 2003.

4. VARGAS, F. ; NICOLAIDIS, M. . A Current Monitoring-Based Technique to Detect and Correct Single-Event Upsets (SEUs) in Static RAMs for Space Applications (Correction d'Erreurs Dans Une Mémoire, Brevet CNRS - 60851 - B2485). Patente Internacional. 1996.

5. VARGAS, F. ; NICOLAIDIS, M. . A Current Monitoring-Based Technique to Detect and Correct Single-Event Upsets (S

 

Letícia Pöhls:

Articles in Scientific Journals:

1.&emspCERATTI, A. ; Copetti, T. ; BOLZANI, L. ; VARGAS, F. ; FAGUNDES, R. . An On-Chip Sensor to Monitor NBTI Effects in SRAMs. Journal of Electronic Testing (Dordrecht. Online), v. 30, p. 159-169, 2014.

2. MARCON, C. ; WEBBER, T. ; BENSO, A. ; CATALDO, R. ; POEHLS, L. ; FERNANDES, R. ; GRANDO, F. . Tiny - optimised 3D mesh NoC for area and latency minimisation. Electronics Letters, v. 50, p. 165-166, 2014.

3. BENFICA, Juliano ; BOLZANI, L. ; VARGAS, Fabian ; LIPOVETZKY, José ; LUTENBERG, Ariel ; GARCIA, Sebastián. E. ; E. Gatti ; F. Hernandez ; GATTI, Edmundo . Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference. IEEE Transactions on Nuclear Science, v. PP, p. 1-5, 2012.

4. F. Lavratti ; CERATTI, A. ; D. Prestes ; BOLZANI, L. ; VARGAS, F. ; MONTEZ, C. ; F. Hernandez ; E. Gatti ; SILVA, C. . A Transmission Power Self-Optimization Technique for Wireless Sensor Networks. ISRN Communications and Networking, v. 2012, p. 1-12, 2012.

5. GRACIA, M. P. ; A. Lindoso ; L. Entrena ; M. Garcia Valderas ; C. Lopez-Ongil ; MARRONI, N. ; B. Pianta ; L. BOLZANI POEHLS ; VARGAS, F. . Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach. Journal of Electronic Testing (Dordrecht. Online), p. 777-789, 2012.

6. J. Benfica ; BOLZANI, L. ; VARGAS, F. ; J. Lipovetzky ; A. Lutenberg ; S. E. Garcia ; E. Gatti ; F. HERNANDEZ . A Test Platform for Dependability Analysis of SoCs Exposed to EMI and TID Radiation. Journal of Electronic Testing, v. 28, p. 803-816, 2012.

7. P. BERNARDI ; L. BOLZANI POEHLS ; M. GROSSO ; M. SONZA REORDA . A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. IEEE Transactions on Dependable and Secure Computing, v. 7, p. 439-445, 2010.

8. F. Lavratti ; BOLZANI, L. ; VARGAS, F. ; J. Semião ; J. J. Rodriguez-Andina ; TEIXEIRA, I. ; TEIXEIRA, J. P. . Clock Signal Modulation for IC Electromagnetic Compatibility. Shanghai Shifan Daxue Xuebao (Ziran Kexue Ban), v. 39, p. 456-461, 2010.

9. BERNARDI, P. ; BOLZANI, L. ; REBAUDENGO, M. ; REORDA SONZA, M. ; VARGAS, F. ; VIOLANTE, M. . A New Hybrid Fault Detection Technique for Systems-on-a-Chip. I.E.E.E. Transactions on Computers (Print), v. 55, p. 185-198-185, 2006.

10. VARGAS, F. ; BOLZANI, L. ; D. Brum ; D. Prestes . Appending On-Line Fault Detection Mechanisms into Application Code to Handle EMI in Embedded Electronics: a Case Study. Ingeniería Electrónica, Automática y Comunicaciones, v. 1, p. 82-90-82, 2004.

 

Book Chapter Published:

1. Pinto, A. ; Letícia Bolzani Poehls ; Montez, C. ; VARGAS, F. . Power Optimization for Wireless Sensor Networks. Wireless Sensor Networks / Book 2. 1ed.Shanghai, China: InTech Open Access Publisher Books, 2012, v. 2, p. 1-19.

 

Complete works published in proceedings of conferences:

 MARCON, CESAR ; FERNANDES, RAMON ; CATALDO, RODRIGO ; GRANDO, FERNANDO ; WEBBER, THAIS ; BENSO, ANA ; POEHLS, LETICIA B. . Tiny NoC: A 3D Mesh Topology with Router Channel Optimization for Area and Latency Minimization. In: 2014 27th International Conference on VLSI Design, 2014, India. 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, 2014. p. 228.

 MARCON, CESAR ; WEBBER, THAIS ; POEHLS, LETICIA B. ; PINOTTI, IGOR K. . Pre-mapping Algorithm for Heterogeneous MPSoCs. In: 2014 27th International Conference on VLSI Design, 2014, India. 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, 2014. p. 252.

 RAIK, JAAN ; KOSTIN, SERGEI ; JENIHHIN, MAKSIM ; UBAR, RAIMUND ; VARGAS, F. ; L. BOLZANI POEHLS ; Copetti, T. . Hierarchical Identification of NBTI- Critical Gates in Nanoscale Logic. In: 15th IEEE Latin-American Test Workshop, 2014, Fortaleza. 15th IEEE Latin-American Test Workshop, 2014.

 MIRYALA, S. ; CALIMERA, A. ; MACII, E. ; PONCINO, M. ; L. BOLZANI POEHLS . Investigating the Behavior of Physical Defects in PN Junction Based Reconfigurable Graphene. In: IEEE 14th Latin-American Test Workshop, 2013, Cordoba. IEEE 14th Latin-American Test Workshop, 2013.

 F. Lavratti ; L. BOLZANI POEHLS ; VARGAS, F. ; CALIMERA, A. ; MACII, E. . Technique Based on On-Chip Current Sensors and Neighborhood Comparison Logic to Detect Resistive-Open Defects in SRAMs. In: IEEE 14th Latin-American Test Workshop, 2013, Cordoba. IEEE 14th Latin-American Test Workshop, 2013.

 CERATTI, A. ; Copetti, T. ; BOLZANI, L. ; VARGAS, F. . Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM. In: 2012 13th Latin American Test Workshop LATW, 2012, Quito. 2012 13th Latin American Test Workshop (LATW).

 BENFICA, Juliano ; POEHLS, LETICIA BOLZANI ; VARGAS, Fabian ; LIPOVETZKY, JOSE ; LUTENBERG, Ariel ; GARCIA, SEBASTIAN E. . Configurable platform for SoC combined tests of TID radiation, aging and EMI. In: 2012 AsiaPacific Symposium on Electromagnetic Compatibility (APEMC), 2012, Singapore. 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.

 CERATTI, A. ; Copetti, T. ; BOLZANI, L. ; VARGAS, F. . On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. In: 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012, Tallinn. 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012. v. 1.

 LAVRATTI, F. ; CALIMERA, A. ; BOLZANI, L. ; VARGAS, F. ; MACII, E. . A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs. In: 2011 12th Latin American Test Workshop LATW, 2011, Beach of Porto de Galinhas. 2011 12th Latin American Test Workshop (LATW).

 BENFICA, Juliano ; POEHLS, LETICIA BOLZANI ; VARGAS, Fabian ; LIPOVETZKY, JOSE ; LUTENBERG, Ariel ; GARCIA, SEBASTIAN E. ; GATTI, Edmundo ; HERNANDEZ, FERNANDO ; CALAZANS, NEY L. V. . Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity. In: 2011 12th Latin American Test Workshop LATW, 2011, Beach of Porto de Galinhas. 2011 12th Latin American Test Workshop (LATW).

 PORTELA-GARCIA, M. ; LINDOSO, A. ; ENTRENA, L. ; GARCIA-VALDERAS, M. ; LOPEZ-ONGIL, C. ; PIANTA, BERNARDO ; POEHLS, LETICIA BOLZANI ; VARGAS, Fabian . Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. In: 2011 12th Latin American Test Workshop LATW, 2011, Beach of Porto de Galinhas. 2011 12th Latin American Test Workshop (LATW).

 BENFICA, J. ; BOLZANI POEHLS, L. M. ; VARGAS, F. ; LIPOVETZKY, J. ; LUTENBERG, A. ; GARCIA, S. E. ; GATTI, E. ; HERNANDEZ, F. ; CALAZANS, N. L. V. . Evaluating the use of a platform for combined tests of total ionizing dose radiation and Electromagnetic immunity, 2011.

 SILVA, DHIEGO ; BOLZANI, LETICIA ; VARGAS, Fabian . An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems. In: 2011 IEEE 17th International OnLine Testing Symposium (IOLTS 2011), 2011, Athens. 2011 IEEE 17th International On-Line Testing Symposium.

 D. Silva ; VARGAS, F. ; BOLZANI, L. ; J. Semião ; TEIXEIRA, I. ; TEIXEIRA, J. P. ; J. J. Rodriguez-Andina ; VALDES, M. ; FREIJEDO, J. . IP Core to Leverage RTOS-Based Embedded Systems Reliability. In: 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO), 2011, Dubrovnik. 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO), 2011.

 CRISTOFOLI, L. F. ; HENGLEZ, A. ; BENFICA, J. ; BOLZANI, L. ; VARGAS, F. ; ATIENZA, A. ; SILVA, F. . On the comparison of synchronous versus asynchronous circuits under the scope of conducted power-supply noise, 2010.

 CHIPANA, R. ; BOLZANI, L. ; VARGAS, F. . BICS-based March test for resistive-open defect detection in SRAMs. In: 2010 11th Latin American Test Workshop LATW, 2010, Punta del Este. 2010 11th Latin American Test Workshop.

 LAVRATTI, F. ; PINTO, A. R. ; PRESTES, D. ; BOLZANI, L. ; VARGAS, F. ; MONTEZ, C. . Towards a transmission power self-optimization in reliable Wireless Sensor Networks, 2010.

 L. F. Cristófoli ; A. Hengles ; J. Benfica ; BOLZANI, L. ; VARGAS, F. ; A. Atienza ; SILVA, F. . Synchronous versus Asynchronous Circuits Reliability under Radiated Electromagnetic Disturbance. In: EMC Europe 2010, 2010, Wroclaw. EMC Europe 2010, 2010.

 LAVRATTI, F. ; PINTO, A.R. ; BOLZANI, L. ; VARGAS, F. ; MONTEZ, C. ; HERNANDEZ, F. ; GATTI, E. ; SILVA, C. . Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments, 2010.

  BOLZANI, L. ; CALIMERA, A. ; MACII, E. ; PONCINO, M. ; MACII, A. . Enabling Concurrent Clock and Power Gating in an Industrial Design Flow. In: IEEE Design, Automation & Test in Europe, 2009, Nice, France. IEEE Design, Automation & Test in Europe, 2009.

 BOLZANI, L. ; CALIMERA, A. ; PONCINO, M. ; MACII, E. ; MACII, A. . Placement-Aware Clustering for Integrated Clock and Power Gating. In: IEEE International Symposium on Circuits and Systems - ISCAS09, 2009, Taipei. IEEE International Symposium on Circuits and Systems, 2009.

 J. Tarrillo ; BOLZANI, L. ; VARGAS, F. . A Hardware-Scheduler for Fault Detection in RTOS-based Embedded Systems. In: 12th EUROMICRO Conference on Digital System Design, 2009, Patras, Greece. 12th EUROMICRO Conference on Digital System Design: Architecture, Methods and Tools, 2009.

 J. Tarrillo ; BOLZANI, L. ; VARGAS, F. ; E. GATTI ; F. HERNANDEZ ; L. FRAIGI . Fault-Detection Capability Analysis of a Hardware-Scheduler IP-Core in Electromagnetic Interference Environment. In: 7th IEEE East-West Design & Test Symposium, 2009, Moscow, Russia. 7th IEEE East-West Design & Test Symposium, 2009.

 BOLZANI, L. ; CALIMERA, A. ; MACII, E. ; PONCINO, M. ; MACII, A. . Integrating Clock Gating and Power Gating for Combined Dynamic and Leakage Power Optimization in Digital CMOS Circuits. In: 11th Euromicro Conference on Digital System Design, 2008, Parma. IEEE Euromicro Conference on Digital System Design, 2008.

 BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. . A Hybrid Approach to Fault Detection and Correction in SoCs. In: IEEE 13th International Online Testing Symposium, 2007, Creta, Grecia. IEEE 13th International Online Testing Symposium, 2007.

 BOLZANI, L. ; SANCHEZ, E. ; SCHILLACI, M. ; Squillero, G. . An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores. In: IEEE 13th International Online Testing Symposium, 2007, Creta, Grecia. IEEE 13th International Online Testing Symposium, 2007.

 BOLZANI, L. ; SANCHEZ, E. ; SCHILLACI, M. ; Squillero, G. . Coupling EA and High-level Metrics for the Automatic Generation of Test Blocks for Peripheral Cores. In: GECCO 07, IEEE Genetic and Evolutionary Computation Conference, 2007, Londres. IEEE Genetic and Evolutionary Computation Conference, 2007.

 BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. . Extended Fault Detection Techniques for Systems-on-Chip. In: 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007, Cracovia. IEEE 10th Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007.

 BOLZANI, L. ; SANCHEZ, E. ; REORDA SONZA, M. . On Test Program Generation for Peripheral Components in a SoC Resorting to High-Level Metrics. In: IEEE 8th Latin American Test Workshop, 2007, Lima. IEEE 8th Latin American Test Workshop, 2007.

  BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. . An optimized hybrid approach to provide fault detection and correction in SoCs. In: 20th Symposium on Integrated Circuits and System Design, 2007, Rio de Janeiro. 20th Symposium on Integrated Circuits and System Design, 2007.

 BOLZANI, L. ; SANCHEZ, E. ; REORDA SONZA, M. . A Software-based Methodology for the Generation of Peripheral Test Sets Based on High-level Descriptions. In: 20th Symposium on Integrated Circuits and System Design, 2007, Rio de Janeiro. 20th Symposium on Integrated Circuits and System Design, 2007.

 BOLZANI, L. ; SANCHEZ, E. ; SCHILLACI, M. ; Squillero, G. . Co-evaluation of Test Programs and Stimuli Vectors for Testing of Embedded Peripheral Cores. In: IEEE Congress on Evolutionary Computation, 2007, Singapora. IEEE Congress on Evolutionary Computation, 2007.

  BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. ; OSSELA, M. ; MANZONE, A. . Software-based on-line ttest of communication peripherals in processor-based systems for automotive applications. In: IEEE 7th Internation Workshop on Microprocessor Test and Verification workshop, 2006. IEEE 7th Internation Workshop on Microprocessor Test and Verification workshop, 2006.

 BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. ; REBAUDENGO, M. ; VIOLANTE, M. . An Integrated Approach to Increasing the Soft-Erros Detection Capabilities. In: IEEE 20th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2005. IEEE 20th International Symposium on Defect and Fault Tolerance in VLSI Systems, 2005.

 BOLZANI, L. ; BERNARDI, P. ; REORDA SONZA, M. ; VARGAS, F. ; REBAUDENGO, M. ; VIOLANTE, M. . Pandora I-IP: an HW/SW approach to Control Flow Checking. In: IEEE 6th Latin American Test Workshop, 2005, Salvador, Bahia. IEEE 6th Latin American Test Workshop, 2005.

 BOLZANI, L. ; BERNARDI, P. ; REBAUDENGO, M. ; REORDA SONZA, M. ; VIOLANTE, M. . On-line Detection of Control-Flow Errors in SoCs by means of an Infrastructure IP core. In: The Internation Conference on Dependable Systems and Networks, 2005, Yokohama. The Internation Conference on Dependable Systems and Networks, 2005.

 BOLZANI, L. ; BERNARDI, P. ; REBAUDENGO, M. ; REORDA SONZA, M. ; VARGAS, F. ; VIOLANTE, M. . On-line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. In: IEEE Dependable Computing Communications Symposium, 2005. IEEE Dependable Computing Communications Symposium.

 BOLZANI, L. ; BERNARDI, P. ; REBAUDENGO, M. ; VARGAS, F. ; REORDA SONZA, M. ; VIOLANTE, M. . Cerberus I-IP: an HW/SW approach to Control Flow Checking. In: 2nd IEEE International Infrastructure IP Workshop, 2004, Charlote. 2nd IEEE International Infrastructure IP Workshop, 2004.

 BOLZANI, L. ; BERNARDI, P. ; REBAUDENGO, M. ; REORDA SONZA, M. ; VIOLANTE, M. . Hybrid Soft Error Detection by means of Infrastructure IP cores. In: 10th IEEE International On-Line Test Symposium, 2004. 10th IEEE International On-Line Test Symposium, 2004.

 BOLZANI, L. ; REBAUDENGO, M. ; REORDA SONZA, M. ; VARGAS, F. ; VIOLANTE, M. . An Infrastructure IP for Soft Error Detection. In: 5th IEEE Latin American Test Workshop, 2004. 5th IEEE Latin American Test Workshop, 2004.

 VARGAS, F. ; BOLZANI, L. ; D. Brum ; D. Prestes ; REORDA SONZA, M. . SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: are they a good remedy? A Case Study on a COTS Microprocessor. In: 9th IEEE International On-Line Test Symposium, 2003. 9th IEEE International On-Line Test Symposium, 2003.

 VARGAS, F. ; BOLZANI, L. ; D. Brum ; D. Prestes ; D. V. Lettnin . On the Mitigation of Conducted Electromagnetic Immunity by Means of SW-Based Fault Handling Mechanisms. In: 4th IEEE Latin American Test Workshop, 2003. 4th IEEE Latin American Test Workshop, 2003.

 VARGAS, F. ; BOLZANI, L. ; D. Brum ; D. Prestes ; D. V. Lettnin ; G. Rodrigues . On the Study of the Effectiveness of SW-Based Fault Handling Mechanisms to Cope with IC Conducted Electromagnetic Interference. In: IX Workshop IBERCHIP, 2003. IX Workshop IBERCHIP, 2003.